atomic force microscope
A microscope that uses a tiny probe mounted on a cantilever to scan the surface of an object. The probe is extremely close to-but does not touch-the surface. As the probe traverses the surface, attractive and repulsive forces arising between it and the atoms on the surface induce forces on the probe that bend the cantilever. The amount of bending is measured and recorded, providing a map of the atoms on the surface. Atomic force microscopes can achieve magnification of a factor of 5 X 106, with a resolution of 2 angstroms, sufficient to resolve individual carbon atoms. Also called scanning force microscope
The Force at Work: Star Wars Words
Words for a galaxy far, far away… The conversations are flowing, and the debates are raging: Do we call Rogue One: A Star Wars Story a stand-alone? A spin-off? A prequel? An offshoot? A sequel? All of the above? Whether you’re a dedicated contributor to Wookieepedia or just proud of yourself for knowing what a Wookiee is, there are some great words at work in a galaxy …
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The American Heritage® Science Dictionary Copyright © 2011. Published by Houghton Mifflin Harcourt Publishing Company. All rights reserved.